Adaptive voltage converter

ABSTRACT

An adaptive voltage converter adapted to compensate for the exponential sensitivities of sub-threshold and near-threshold circuits. The converter can change its power/performance characteristics between different energy modes. The converter may comprise two or more voltage converters/regulators. A multiplexing circuit selects between the outputs of the several converters/regulators depending on the state of a control signal generated by a control facility. The converter is specially adapted to change the output of each converter/regulator based on a number of variables, including, for example, process corner, temperature and input voltage.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is:

-   -   1. a Continuation of U.S. application Ser. No. 15/516,883, filed         4 Apr. 2017 (“Parent U.S. Application”);     -   2. which in turn is the U.S. National Stage of PCT Application         No. PCT/US15/50239, filed 15 Sep. 2015 (“Parent PCT         Application”);     -   3. which is turn is related, and claims priority to, Provisional         Application No. 62/066,218, filed 20 Oct. 2014 (“Parent         Provisional”).

This application is related to U.S. application Ser. No. 14/855,105, filed 15 Sep. 2015 (“First Related Application”), now U.S. Pat. No. 9,703,313, issued 11 Jul. 2017.

This application claims priority to:

-   -   4. the Parent U.S. Application;     -   5. the Parent PCT Application; and     -   6. the Parent Provisional;         collectively, “Priority References”, and hereby claims benefit         of the filing dates thereof pursuant to 37 CFR § 1.78(a)(4).

The subject matter of the Priority References and the First Related Application, each in its entirety, is expressly incorporated herein by reference.

BACKGROUND OF THE INVENTION 1. Field of the Invention

The present invention relates to an adaptive voltage converter for use with sub-threshold and near-threshold circuits.

2. Description of the Related Art

In general, in the descriptions that follow, the first occurrence of each special term of art that should be familiar to those skilled in the art of integrated circuits (“ICs”) and systems will be italicized. In addition, when a term that may be new or that may be used in a context that may be new, that term will be set forth in bold and at least one appropriate definition for that term will be provided. In addition, throughout this description, the terms assert and negate may be used when referring to the rendering of a signal, signal flag, status bit, or similar apparatus into its logically true or logically false state, respectively, and the term toggle to indicate the logical inversion of a signal from one logical state to the other. Alternatively, the mutually exclusive boolean states may be referred to as logic_0 and logic_1. Of course, as is well known, consistent system operation can be obtained by reversing the logic sense of all such signals, such that signals described herein as logically true become logically false and vice versa. Furthermore, it is of no relevance in such systems which specific voltage levels are selected to represent each of the logic states.

Hereinafter, reference to a facility shall mean a circuit or an associated set of circuits adapted to perform a particular function regardless of the physical layout of an embodiment thereof. Thus, the electronic elements comprising a given facility may be instantiated in the form of a hard macro adapted to be placed as a physically contiguous module, or in the form of a soft macro the elements of which may be distributed in any appropriate way that meets speed path requirements. In general, electronic systems comprise many different types of facilities, each adapted to perform specific functions in accordance with the intended capabilities of each system. Depending on the intended system application, the several facilities comprising the hardware platform may be integrated onto a single IC, or distributed across multiple ICs. Depending on cost and other known considerations, the electronic components, including the facility-instantiating IC(s), may be embodied in one or more single- or multi-chip packages. However, unless expressly stated to the contrary, the form of instantiation of any facility shall be considered as being purely a matter of design choice.

In the Related Application, circuits adapted to operate in the sub-threshold domain have been disclosed. Perhaps the single greatest challenge of operating circuits in the sub-threshold domain is the exponential sensitivity of circuit parameters to manufacturing process variations and operating temperature. Even circuits that operate at near-threshold voltages experience near-exponential sensitivity to temperature and process. Referring to FIG. 8, which illustrates, in graphical form, sub-threshold and near-threshold voltage ranges according to some embodiments, for the purposes of this description, near-threshold voltages shall be defined as comprising substantially the near-exponential region between about V_(dd)=V_(th) and about V_(dd)=V_(th)+0.4 volts. These exponential sensitivities result in switching speed and power fluctuations that are intolerable in most applications. It is therefore desirable to adapt the circuit under changing process and temperature conditions to maintain constant or near-constant performance and power.

As is known, the tuning of the voltage level with respect to temperature must be carried out differently in sub-threshold and near-threshold than in super-threshold. Super-threshold circuits have a relatively low sensitivity to temperature and process variations, and tend to operate more slowly at higher temperatures. In contrast, sub-threshold circuits have exponential sensitivities to temperature and process, and actually operate faster at higher temperatures. Consequently, to maintain constant performance in a sub-threshold or near-threshold circuit across temperature, supply voltage must increase as temperature falls and decrease as temperature increases. Such a characteristic, which may or may not be substantially linear, is typically called complementary-to-absolute-temperature (“CTAT”).

Adjusting the supply voltage (“V_(DD)”) is considered to be one of the best techniques for adapting power and performance under changing process and temperature. In sub-threshold circuits, circuit speed changes exponentially with V_(DD). Most circuits already have integrated voltage conversion circuitry, and this circuitry can be converted to an adaptive supply with only minimal overhead. However, what is needed is an adaptive voltage converter designed specifically to compensate for the exponential sensitivities of sub-threshold and near-threshold circuits.

Another important challenge in sub-threshold and near-threshold circuits is the extreme disparity between the power/performance requirements when a system is in an active mode and the power/performance requirements when a system is in a sleep mode. Voltage regulators are among the most important circuit blocks in a sub-threshold or near-threshold chip, and it is extremely challenging to design a single voltage converter that can simultaneously meet the bandwidth requirements of active mode and the ultra-low quiescent current requirements of sleep mode. In light of this, it is desirable to create a voltage converter that can adapt as the system moves from active mode to sleep mode. What is needed is an adaptive voltage converter that can change its power/performance characteristics between different energy modes.

BRIEF SUMMARY OF THE INVENTION

In one embodiment, an integrated circuit that includes an adaptive voltage converter facility adapted to deliver to a load a regulated voltage, the adaptive voltage converter facility including a storage facility, and a first voltage converter, a voltage conversion method comprising the steps of developing a first tuning parameter as a function of a process corner, storing in the storage facility the first tuning parameter, and developing by the first voltage converter a first regulated voltage as a function of the first tuning parameter, the first regulated voltage being further characterized as a selected one of sub-threshold voltage (Vdd<Vth) and near-threshold voltage (Vth<=Vdd<=(Vth+0.4 volts)).

In one other embodiment, a voltage conversion method adapted to deliver to a load a regulated voltage, the method comprising the steps of developing a first tuning parameter and a second tuning parameter each as a function of a process corner, storing the first tuning parameter and the second tuning parameter, developing a reference voltage as a function of the first tuning parameter and the second tuning parameter, developing a first regulated voltage as a function of the first tuning parameter, the second tuning parameter, and the reference voltage; and selecting as the regulated voltage the first regulated voltage.

In yet another embodiment, an adaptive voltage converter facility manufactured using a selected process having a process corner, a method comprising using the voltage conversion facility to perform the steps of developing a first tuning parameter as a function of the process corner, and developing a first regulated voltage as a function of the first tuning parameter.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

The several embodiments may be more fully understood by a description of certain preferred embodiments in conjunction with the attached drawings in which:

FIG. 1 illustrates, in block diagram form, a general-purpose computer system adapted to instantiate any of the several embodiments;

FIG. 2 illustrates, in block diagram form, a typical integrated system adapted to practice any of the several embodiments;

FIG. 3 illustrates, in block schematic form, one embodiment of an adaptive voltage converter;

FIG. 4 illustrates, in circuit diagram form, one other embodiment of a reference voltage generator;

FIG. 5 illustrates, in flow diagram form, one method for operating the adaptive voltage converter;

FIG. 6 illustrates, in circuit diagram form, one embodiment of a buck converter; and

FIG. 7 illustrates, in circuit diagram form, one embodiment of a linear voltage regulator.

FIG. 8 illustrates, in graphical form, sub-threshold and near-threshold voltage ranges according to some embodiments.

In the drawings, similar elements will be similarly numbered whenever possible. However, this practice is simply for convenience of reference and to avoid unnecessary proliferation of numbers, and is not intended to imply or suggest that identity is required in either function or structure in the several embodiments.

DETAILED DESCRIPTION OF THE INVENTION

Shown in FIG. 1 is a typical general purpose computer system 10. Although not all of the electronic components illustrated in FIG. 1 may be operable in the sub-threshold or near-threshold domains in any particular embodiment, some, at least, may be advantageously adapted to do so, with concomitant reductions in system power dissipation. In particular, in recently-developed battery-powered mobile systems, such as smart-phones and the like, many of the discrete components typical of desktop or laptop devices illustrated in FIG. 1 are integrated into a single integrated circuit chip.

Shown in FIG. 2 is a typical integrated system 12 comprising, inter alia, reference voltage (“V_(Ref)”) generator 14, reference current (“I_(Ref)”) generator 16, several digital modules, and several analog modules. An example of an analog module is analog to digital converter (“ADC”) 18. Reference voltage generator 14 and reference current generator 16 are each common modules for supplying a stable reference to such analog modules. Reference voltage generator 14 is sometimes used to derive the output reference current provided by reference current generator 16. Also, reference voltage generator 14 and reference current generator 6 may be used to supply a stable reference to modules throughout integrated system 12.

For convenience of reference, in the system illustrated in FIG. 2, one instantiation of the voltage converter 20 is illustrated. In general, the voltage converter 20 is adapted to deliver to a load, e.g., any of the several components comprising system 12, a regulated voltage having a selected one of a first current capability and a second current capability substantially less than the first current capability. In accordance with the method at least one of the first and second voltages is dynamically adjusted as a function complementary to absolute temperature.

Shown in greater detail in FIG. 3 is one embodiment of the adaptive voltage converter 20. A battery 22 supplies a voltage, V_(Bat), to converter 20, which generates a lower regulated voltage, V_(Reg), that may be delivered to a load circuit 24, which can be a circuit of any type. The voltage V_(Reg) may be sub-threshold, near-threshold or super-threshold. In general, the converter 20 may comprise two or more voltage converters/regulators 26, of which only two are illustrated in FIG. 3. A multiplexing circuit 28 selects between the outputs of the several converters/regulators 26 depending on the state of a control signal 32 generated by a control facility 34. Control 34 also selectively enables and/or disables each of the converters/regulators 26; and a voltage reference V_(Ref) generator 36. In addition to basic voltage regulation, the converter 20 may be adapted to change the output of each converter/regulator 26 based on a number of variables, including, for example, process corner, temperature and input voltage. Details of important elements and variants of the invention will described below, as will a specific implementation.

As has been noted, in the embodiment illustrated in FIG. 3, converter 20 comprises two converters: a buck converter 26 a for high-efficiency conversion during active mode, and a linear voltage regulator 26 b for ultra-low quiescent current operation during sleep mode. If one of the converters 26 is in use, it would be typical to power down the other unused converter 26 to save energy. In this embodiment, the buck converter 26 a will generally be enabled when the system 12 is in active mode with loads on the order of 100 μA to 5 mA. In such a mode, buck converter 26 a is capable of delivering power at a variety of voltages (including sub-threshold and near-threshold voltages) with power efficiencies exceeding 90%. However, load currents in a sub-threshold or near-threshold circuit may fall below 100 nA in a sleep mode, and the power efficiency of buck converter 26 a could easily fall below 5%. In this sleep mode, it may be desirable to switch over to a second converter that offers better power efficiency. For example, linear voltage regulator 26 b can be easily adapted to operate with quiescent current on the order of 1 nA yet be capable of delivering much great power efficiency with load currents on the order of 100 nA. Typically, such an embodiment of linear regulator 26 b will be incapable of sourcing active load currents in the range of 100 μA to 5 mA, but automatic switchover to the buck converter 26 a in active mode solves this problem.

It is common for microcontrollers (“MCUs”) to have architected power states (e.g., an active state, a sleep state, a deep sleep state, etc.). Typically, such an MCU will have a power management unit (“PMU”) that is responsible for switching between architected power states. Since the PMU is driving transitions between power states, it may also be used as the control 34 in FIG. 3 to drive transitions between voltage converters (e.g., from buck converter 26 a to linear regulator 26 b) in the converter 20.

As is known, transitions between voltage converters can also be driven by components in addition to the PMU. For example, a serial communications interface (“SCI”) might remain active while the MCU is in a sleep state. Normally, linear regulator 26 b would be enabled because the system 12 is in a sleep state. However, the SCI is still active and may require a high-performance converter like the buck converter 26 a. Consequently, it may be desirable to permit the SCI to request that the buck converter 26 a remain powered on and selected despite the system 12 transitioning to a sleep state.

Transitions between voltage converters can also be driven by current sense circuitry. For example, if a current sensor circuit (not shown) detects that the load current has fallen below some predetermined threshold, then the converter 20 can switch over from buck converter 26 a, which has a high load capability, to linear regulator 26 b, which has a low load capability.

Control of the converter 20 can be achieved via software, but this may sometimes be challenging and confusing for software developers. It may therefore be desirable to automate the transitions between voltage converters 26 based on the architectural power state of the system and based on the activity of peripherals in the system (e.g., the SCI).

While thus far focus has been on switching between converters 26, each individual converter 26[a::b] can also be designed to adapt to changing conditions and/or changing control signals. For example, buck converter 26 a can change the on-time of the power switch transistor (“T_(on)”)) (not shown) depending on changing input value (i.e., conversion ratio), changing load current, a changing control signal, or a variety of other inputs. In contrast, linear regulator 26 b can adapt the tail current of its main amplifier (not shown) depending on its load current, a changing control signal, or a variety of other inputs.

In some implementations, the converter 20 may not contain two separate converters 26. It may instead contain a single voltage converter 26 that adapts to the power state of the load circuit. For example, linear regulator 26 b may be adapted to use a tail current of 1 μA in active mode to ensure adequate bandwidth for large active mode loads, while in sleep mode regulator 26 b may be reconfigured to use a tail current of 1 nA.

The multiplexor 28 in FIG. 3 can be implemented using any known multiplexing technique including a pass transistor multiplexor, a transmission gate multiplexor, a wired-OR multiplexor implementation, and any of a variety of other known embodiments. The multiplexor 28 may also be designed to accommodate different timing relationships during switch-over from one converter 26 to another. The multiplexor 28 can pass the outputs of two converters 26 at once during switch-over from one converter to another to ensure a reliable output voltage. Conversely, the multiplexor 28 can block both converters 26 for a period of time when switching from one to another. The multiplexor 28 can also switch instantaneously from one to another.

It is typical for the converters 26 in FIG. 3 to share off-chip and on-chip passives (e.g., compensation capacitors) to save cost and area, though this is not required. In addition, converters 26 will generally share an input voltage, though they may also have different input voltages. Although converters 26 will generally provide the same output voltage, this is not required. For example, buck converter 26 a used in active mode might provide a low voltage to minimize power while actively awake; but linear regulator 26 b used in sleep mode might allow voltage to float higher since voltage level is not as important in sleep mode. Similarly, the converters 26 can have different compensation behavior. Thus, in the previous example, buck converter 26 a might be temperature compensated while linear regulator 26 b might not be temperature compensated at all.

As previously mentioned, an adaptive voltage supply is one of the best available tools to manage the exponential sensitivities of sub-threshold and near-threshold circuits. In one embodiment of the adaptive voltage converter 20, the V_(Reg) voltage level is adjusted in response to different manufacturing process variations or environmental conditions. The tuning of the voltage level can be software controlled or can be controlled by a control circuit in a closed-loop fashion. The voltage level output by a particular converter 26 can be controlled by changing the reference voltage, the voltage converter gain, or any other available tuning parameter with respect to temperature and/or process.

In one embodiment, the V_(Reg) voltage is dynamically adjusted as a function complementary to absolute temperature. Although the generation of such a function can be achieved in an open-loop manner with software that periodically measures temperature with a sensor (not shown), it may be desirable to construct a closed-loop circuit that requires no software intervention. For example, two-transistor sub-threshold reference voltage generator 36′ shown in FIG. 4 can be easily adapted to adjust the V_(Reg) voltage as a function complementary to absolute temperature simply by changing the size of one of the transistors M1-M2. Such an embodiment, used in the converter 20, automatically forces V_(Reg) to vary as a function complementary to absolute temperature without software intervention.

The tuning of the voltage level with respect to variations in the manufacturing process is also important. In general, this tuning step is best done at the time of production test. Tuning parameters can be stored in an on-board non-volatile memory (not shown) and then loaded upon powering up for the first time. For chips that exhibit slow process characteristics (e.g., high threshold voltage or long gate length), the regulated voltage will generally be adjusted to a higher level to ensure a minimum performance level. Conversely, the regulated voltage will generally be adjusted down to save energy while maintaining performance for chips with faster process characteristics. Any known trimming algorithm may be used for determining the correct voltage level settings.

Though this discussion has focused mainly on the adaptation of supply voltage in response to temperature and process fluctuations, V_(Reg) can also be adapted to other factors. For example, as the system's workload changes, V_(Reg) can be changed accordingly. The system might remain in a sub-threshold or near-threshold low performance, low energy mode while handling background tasks like sensing and data movement. When handling applications with real-time requirements, the system might automatically increase voltage to a super-threshold voltage to achieve higher performance at the expense of energy efficiency.

Many of the aforementioned characteristics rely on tuning of the system 12 to minimize variations across process and temperature. This requires careful calibration at the time of post-manufacturing test. Manufacturing test requires a means to read out each important voltage. including reference voltages, internal nodes of feedback dividers, and regulated outputs. This is typically achieved by having an on-chip multiplexer (not shown) with a buffering amplifier (e.g., see FIG. 7 in the Related Application) that can alternately select each voltage of interest. Manufacturing test also employs a means to store calibrated values in a non-volatile manner on chip. This can be achieved using flash memory, one-time programmable memory, fuses, or any other means of non-volatile data storage. Any known trimming algorithm or method may be used to set the correct calibration settings for all previously discussed trimmable elements.

In accordance with the switch-over method illustrated in FIG. 5, when the load circuit 24 initially switches into the active mode, V_(Reg) is sourced by buck converter 26 a with high power efficiency and high current drive capability. When the load circuit 24 thereafter switches into sleep mode, control 34 powers up linear regulator 26 b, which exhibits excellent low current drive capability and extremely low quiescent current. After giving the regulator 26 b sufficient time to warm up, control 34 switches multiplexer 28 to source the load current from the linear regulator 26 b. After a short delay, the control 34 powers down the buck converter 26 a. Similarly, when the load circuit 24 switches into active mode, control 34 powers up buck converter 26 a. After giving buck converter 26 a time to warm up, control 34 switches multiplexer 28 to source the load current from the buck converter 26 a. After a short delay, control 34 powers down the linear regulator 26 b.

In one embodiment, V_(Ref) generator 36 is tuned to have a low temperature coefficient (“TC”) (i.e., a near-zero coefficient). In this embodiment, control 34 provides a first tuning parameter 38 a to tune the absolute value of the reference across process; and a second tuning parameter 38 b to tune out process variations in the temperature coefficient of the voltage reference.

As illustrated in the embodiment illustrated in FIG. 3, buck converter 26 a receives multiple control signals from control 34: a first signal 40 a controls the absolute value of the feedback network's divide ratio; a second signal 40 b controls the temperature co-efficient of the feedback divide ratio; and a third signal 40 c controls whether buck converter 26 a is powered up or powered down. A more detailed diagram of the buck converter 26 a is shown in FIG. 6. The buck converter 26 a uses a pulse frequency modulation scheme with transistors operating in a mix of sub-threshold, near-threshold and super-threshold regimes. The feedback network 44 a is a resistive divider that is highly tunable, with a current source adapted to provide a bias current as a function that is positive to absolute temperature (“PTAT”). As previously stated, the first signal 40 a is used to control the divide ratio to combat process variations, and the second signal 40 b is used to control the temperature coefficient; both the first signal 40 a and the second signal 40 b are typically set during IC manufacturing, but, if desired, may be changed dynamically to adapt to current operating conditions. The temperature co-efficient is selected to ensure that V_(Reg) varies as a function complementary to absolute temperature, thereby ensuring that sub-threshold and near-threshold circuits have operating speeds that remain substantially constant across temperature. The feedback network 44 a, and, in particular, the PTAT current source, includes active amplifiers to ensure tunability of the temperature co-efficient. One suitable PTAT current source is the band-gap reference circuit shown in FIG. 11.18 on page 391 of Design of Analog CMOS Integrated Circuits, B. Razavi, McGraw Hill 2001.

As illustrated in the embodiment illustrated in FIG. 3, linear regulator 26 b receives multiple control signals from control 34: a first signal 42 a controls the absolute value of the feedback network's divide ratio; a second signal 42 b controls the temperature co-efficient of the feedback divide ratio; and a third signal 42 c controls whether linear regulator 26 b is powered up or powered down. A more detailed diagram of the linear regulator 26 b is shown in FIG. 7. The linear regulator 26 b uses an amplifier biased in the sub-threshold region with tail current much less than 1 nA. Like the buck converter 26 a, the linear regulator 26 b has a feedback network 44 b that is a highly tunable resistive divider. The first signal 42 a is used to control the divide ratio to combat process variations, and the second signal 42 b is used to control the temperature coefficient of the feedback divide ratio. The feedback network 44 b includes active amplifiers to ensure tunability of the temperature co-efficient. This feedback network 44 b can be shared with that of the buck converter 26 a to save area and power. As in the case of the buck converter 26 a, the temperature co-efficient is selected to ensure that V_(Reg) varies as a function complementary to absolute temperature.

Although described in the context of particular embodiments, one of ordinary skill in this art will readily realize that many modifications may be made in such embodiments to adapt either to specific implementations.

Thus it is apparent that an adaptive voltage converter designed specifically to compensate for the exponential sensitivities of sub-threshold and near-threshold circuits has been disclosed. This adaptive voltage converter is also adapted to change its power/performance characteristics between different energy modes. Further, this method and apparatus provides performance generally superior to the best prior art techniques. 

What is claimed is:
 1. In an integrated circuit comprising an adaptive voltage converter facility adapted to deliver to a load a regulated voltage, said adaptive voltage converter facility comprising: a storage facility; and a first voltage converter; a voltage conversion method comprising the steps of: storing in said storage facility a first tuning parameter, said first tuning parameter being developed as a function of a process corner; and developing by said first voltage converter a first regulated voltage as a function of said first tuning parameter, said first regulated voltage being further characterized as a selected one of sub-threshold (Vdd<Vth) and near-threshold (Vth<=Vdd<=(Vth+0.4 volts)).
 2. The method of claim 1 wherein said first tuning parameter adjusts an absolute value of said first regulated voltage.
 3. The method of claim 1 wherein said storage facility is a non-volatile memory.
 4. The method of claim 1 wherein said voltage converter is adapted to operate in a selected one of two current consumption modes.
 5. A non-transitory computer readable storage medium storing computer readable instructions which, when executed in a processing system, causes the processing system to perform the steps of the method according to claim
 1. 6. The method of claim 1 wherein said first tuning parameter adjusts a temperature coefficient of said first regulated voltage.
 7. The method of claim 6 wherein said temperature coefficient is further characterized as complementary to absolute temperature.
 8. A voltage converter facility configured to perform the method of claim
 1. 9. An electronic system comprising a voltage converter facility according to claim
 8. 10. The method of claim 1 wherein said voltage conversion method further comprises the steps of: developing a second tuning parameter; storing in said storage facility said second tuning parameter; and developing by said first voltage converter said first regulated voltage as a function of said first tuning parameter and said second tuning parameter.
 11. The method of claim 10 wherein said first tuning parameter adjusts an absolute value of said first regulated voltage and said second tuning parameter adjusts a temperature coefficient of said first regulated voltage.
 12. The method of claim 11 wherein said temperature coefficient is further characterized as complementary to absolute temperature.
 13. The method of claim 1 wherein said adaptive voltage converter facility further comprises a reference voltage generator; and said voltage conversion method further comprising the steps of: storing in said storage facility a second tuning parameter; developing by said reference voltage generator a reference voltage as a function of said first tuning parameter and said second tuning parameter; and developing by said first voltage converter said first regulated voltage as a function of said first tuning parameter, said second tuning parameter, and said reference voltage.
 14. The method of claim 13 wherein said adaptive voltage converter facility further comprises: a second voltage converter; said voltage conversion method further comprising the steps of: developing by said second voltage converter a second regulated voltage; and selecting as said regulated voltage one of said first regulated voltage and second regulated voltage as a function of a current consumption of said load.
 15. The method of claim 14 wherein said first tuning parameter adjusts an absolute value of a selected one of said first regulated voltage and said second regulated voltage.
 16. The method of claim 14 wherein said second tuning parameter adjusts a temperature coefficient of a selected one of said first regulated voltage and said second regulated voltage.
 17. The method of claim 16 wherein said temperature coefficient is further characterized as complementary to absolute temperature. 